USPC Class Details

Description: 378 x-ray or gamma ray systems or devices / 378 x-ray or gamma ray systems or devices/(1) specific application (70) diffraction, reflection, or scattering analysis (71) diffractometry (73) crystalography (75) powder technique

Hierarchy/Derived subclasses

378 / 1-> 70-> 71-> 73-> 75

uspto searches

Patent Apps in 378/75

Granted Patents in 378/75

Use the links above or do an advanced search in ppubs for:
(378/75.ccls.)

This will show what classes derive from the input. Ex: entering 43/42.24 shows the derived classes and the search that can be used to find patents or patent applications in those subclasses.
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