USPC Class Details

Description: 702 data processing: measuring, calibrating, or testing / 702 data processing: measuring, calibrating, or testing/(108) testing system (124) signal generation or waveform shaping

Hierarchy/Derived subclasses

702 / 108-> 124-> 125
  -> 126

uspto searches

Patent Apps in 702/124

Granted Patents in 702/124

Use the links above or do an advanced search in ppubs for:
(702/124.ccls. or 702/125.ccls. or 702/126.ccls.)

This will show what classes derive from the input. Ex: entering 43/42.24 shows the derived classes and the search that can be used to find patents or patent applications in those subclasses.
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