USPC Class Details

Description: 702 data processing: measuring, calibrating, or testing / 702 data processing: measuring, calibrating, or testing/(127) measurement system (173) weight

Hierarchy/Derived subclasses

702 / 127-> 173-> 174
  -> 175

uspto searches

Patent Apps in 702/173

Granted Patents in 702/173

Use the links above or do an advanced search in ppubs for:
(702/173.ccls. or 702/174.ccls. or 702/175.ccls.)

This will show what classes derive from the input. Ex: entering 43/42.24 shows the derived classes and the search that can be used to find patents or patent applications in those subclasses.
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