USPC Class Details

Description: 702 data processing: measuring, calibrating, or testing / 702 data processing: measuring, calibrating, or testing/(127) measurement system (155) dimensional determination (170) thickness or width (171) by ultrasonic

Hierarchy/Derived subclasses

702 / 127

-> 155

-> 170

-> 171

uspto searches

Patent Apps in 702/171

Granted Patents in 702/171

Use the links above or do an advanced search in ppubs for:
(702/171.ccls.)

This will show what classes derive from the input. Ex: entering 43/42.24 shows the derived classes and the search that can be used to find patents or patent applications in those subclasses.

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