USPC Class Details

Description: 702 data processing: measuring, calibrating, or testing / 702 data processing: measuring, calibrating, or testing/(127) measurement system (189) measured signal processing (190) signal extraction or separation (e.g., filtering) (191) for noise removal or suppression (193) by threshold comparison

Hierarchy/Derived subclasses

702 / 127

-> 189

-> 190

-> 191

-> 193

uspto searches

Patent Apps in 702/193

Granted Patents in 702/193

Use the links above or do an advanced search in ppubs for:
(702/193.ccls.)

This will show what classes derive from the input. Ex: entering 43/42.24 shows the derived classes and the search that can be used to find patents or patent applications in those subclasses.

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