USPC Class Details

Description: 702 data processing: measuring, calibrating, or testing / 702 data processing: measuring, calibrating, or testing/(1) measurement system in a specific environment (33) mechanical measurement system (35) flaw or defect detection

Hierarchy/Derived subclasses

702 / 1	-> 33	-> 35	-> 36
			-> 38
			-> 39
			-> 40

uspto searches

Patent Apps in 702/35

Granted Patents in 702/35

Use the links above or do an advanced search in ppubs for:
(702/35.ccls. or 702/36.ccls. or 702/38.ccls. or 702/39.ccls. or 702/40.ccls.)

This will show what classes derive from the input. Ex: entering 43/42.24 shows the derived classes and the search that can be used to find patents or patent applications in those subclasses.

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