USPC Class Details

Description: 702 data processing: measuring, calibrating, or testing / 702 data processing: measuring, calibrating, or testing/(1) measurement system in a specific environment (57) electrical signal parameter measurement system (66) waveform analysis

Hierarchy/Derived subclasses

702 / 1	-> 57	-> 66	-> 67	-> 68
			-> 69
			-> 70
			-> 71	-> 72
				-> 73
				-> 74
			-> 75	-> 76	-> 77
				-> 78

uspto searches

Patent Apps in 702/66

Granted Patents in 702/66

Use the links above or do an advanced search in ppubs for:
(702/66.ccls. or 702/67.ccls. or 702/68.ccls. or 702/69.ccls. or 702/70.ccls. or 702/71.ccls. or 702/72.ccls. or 702/73.ccls. or 702/74.ccls. or 702/75.ccls. or 702/76.ccls. or 702/77.ccls. or 702/78.ccls.)

This will show what classes derive from the input. Ex: entering 43/42.24 shows the derived classes and the search that can be used to find patents or patent applications in those subclasses.

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