USPC Class Details

Description: 702 data processing: measuring, calibrating, or testing / 702 data processing: measuring, calibrating, or testing/(1) measurement system in a specific environment (57) electrical signal parameter measurement system (66) waveform analysis (75) frequency (78) by count (e.g., pulse)

Hierarchy/Derived subclasses

702 / 1

-> 57

-> 66

-> 75

-> 78

uspto searches

Patent Apps in 702/78

Granted Patents in 702/78

Use the links above or do an advanced search in ppubs for:
(702/78.ccls.)

This will show what classes derive from the input. Ex: entering 43/42.24 shows the derived classes and the search that can be used to find patents or patent applications in those subclasses.

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